Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data : PROPHESY
Ozon, Matthew; Tumashevich, Konstantin; Lin, Jack J.; Prisle, Nønne L. (2023-08-23)
Ozon, M., Tumashevich, K., Lin, J. J., & Prisle, N. L. (2023). Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data: PROPHESY. Journal of Synchrotron Radiation, 30(5), 941–961. https://doi.org/10.1107/S1600577523006124
© The Author(s) 2023. Published under a CC BY 4.0 licence.
https://creativecommons.org/licenses/by/4.0/
https://urn.fi/URN:NBN:fi-fe20231013140041
Tiivistelmä
Abstract
PROPHESY, a technique for the reconstruction of surface-depth profiles from X-ray photoelectron spectroscopy data, is introduced. The inversion methodology is based on a Bayesian framework and primal-dual convex optimization. The acquisition model is developed for several geometries representing different sample types: plane (bulk sample), cylinder (liquid microjet) and sphere (droplet). The methodology is tested and characterized with respect to simulated data as a proof of concept. Possible limitations of the method due to uncertainty in the attenuation length of the photo-emitted electron are illustrated.
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