Guest editorial : metrology for 5G technologies

Fan, Wei; Chen, Xiaoming; Kyösti, Pekka; Rumney, Moray; Loh, Tian Hong (2019-12-05)
 
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https://doi.org/10.1049/iet-map.2019.0982

Fan, Wei
Chen, Xiaoming
Kyösti, Pekka
Rumney, Moray
Loh, Tian Hong
Institution of Electrical Engineers
05.12.2019

"Guest Editorial: Metrology for 5G Technologies," in IET Microwaves, Antennas & Propagation, vol. 13, no. 15, pp. 2581-2583, 18 12 2019, doi: 10.1049/iet-map.2019.0982

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© Institution of Engineering and Technology 2019. Self-archived here with the kind permission of the publisher. The Definitive Version of Record can be found online at https://doi.org/10.1049/iet-map.2019.0982.
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doi:https://doi.org/10.1049/iet-map.2019.0982
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