Flexible electronics non-destructive uniformity characterization by synchronized thermography

Remes, Kari; Latomäki, Antti; Fabritius, Tapio (2019-09-09)
 
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https://doi.org/10.1109/I2MTC.2019.8827135

Remes, Kari
Latomäki, Antti
Fabritius, Tapio
Institute of Electrical and Electronics Engineers
09.09.2019

K. Remes, A. Latomäki and T. Fabritius, "Flexible Electronics Non-Destructive Uniformity Characterization by Synchronized Thermography," 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Auckland, New Zealand, 2019, pp. 1-5. doi: 10.1109/I2MTC.2019.8827135

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doi:https://doi.org/10.1109/I2MTC.2019.8827135
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https://urn.fi/URN:NBN:fi-fe202003249034
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Abstract

Synchronized thermography (ST) is utilized in the characterization of a flexible hybrid electronics. ST is used for both in the analysis of the structural uniformity and electrical functionality. Flexible lighting foils combining conventionally manufactured light-emitting diode (LED) chips and current regulators with a printed wiring on polyethylene terephthalate (PET) substrate were used as test samples. The measurement results proves that ST measurement method is a feasible method for the uniformity and electrical functionality characterization of large-area printed thin films with conventional electronics. ST is an interesting option to be used as a measurement tool for online quality monitoring of hybrid electronics manufacturing.

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