Quantification of bonded Ni atoms for Ni-MoS₂ metallic contact through X-ray photoemission electron microscopy

Shi, Xinying; Huttula, Marko; Pankratov, Vladimir; Hoszowska, Joanna; Dousse, Jean-Claude; Zeeshan, Faisal; Niu, Yuran; Zakharov, Alexei; Huang, Zhongjia; Wang, Gang; Posysaev, Sergei; Miroshnichenko, Olga; Alatalo, Matti; Cao, Wei (2018-08-10)
 
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URL:
https://doi.org/10.1017/S1431927618014526

Shi, Xinying
Huttula, Marko
Pankratov, Vladimir
Hoszowska, Joanna
Dousse, Jean-Claude
Zeeshan, Faisal
Niu, Yuran
Zakharov, Alexei
Huang, Zhongjia
Wang, Gang
Posysaev, Sergei
Miroshnichenko, Olga
Alatalo, Matti
Cao, Wei
Cambridge University Press
10.08.2018

Shi, X., Huttula, M., Pankratov, V., Hoszowska, J., Dousse, J., Zeeshan, F., ...Cao, W. (2018). Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy. Microscopy and Microanalysis, 24(S2), 458-459. doi:10.1017/S1431927618014526

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© Microscopy Society of America 2018.
https://rightsstatements.org/vocab/InC/1.0/
doi:https://doi.org/10.1017/S1431927618014526
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https://urn.fi/URN:NBN:fi-fe2018082834233
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