Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices
Chernova, E.; Brooks, C.; Chvostova, D.; Bryknar, Z.; Dejneka, A.; Tyunina, M. (2017-11-01)
E. Chernova, C. Brooks, D. Chvostova, Z. Bryknar, A. Dejneka, and M. Tyunina, "Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices," Opt. Mater. Express 7, 3844-3862 (2017)
© 2017 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
https://rightsstatements.org/vocab/InC/1.0/
https://urn.fi/URN:NBN:fi-fe2019050814744
Tiivistelmä
Abstract
The optical properties of several commonly used single-crystal oxide substrates were explored by spectroscopic ellipsometry over a wide spectral range from 0.74 eV to 8.8 eV. The crystals examined are (100) SrTiO₃, 0.7 % wt Nb-doped (100) SrTiO₃,(100) (LaAlO₃)₀.₂₉(SrAl₀.₅Ta₀.₅O₃)₀.₇, (011) DyScO₃, (100) MgAl₂O₄, (100) MgO, and (100) LaAlO₃, all of which enable epitaxial growth of numerous perovskite-type and other optical thin films. An analytic form for the complex dielectric function was derived from ellipsometric data through a physically consistent modeling process. The obtained dielectric spectra were further utilized to calculate the complex index of refraction and absorption coefficient for each substrate material. The absorption spectra and optical band gap were analyzed using Tauc plots. The parameters for reconstructing the dielectric functions are given in detail, allowing for extensive applications of the results of this work.
Kokoelmat
- Avoin saatavuus [38821]