Focus classification in digital holographic microscopy using deep convolutional neural networks

Pitkäaho, Tomi; Manninen, Aki; Naughton, Thomas J. (2017-07-28)
 
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https://doi.org/10.1117/12.2286161

Pitkäaho, Tomi
Manninen, Aki
Naughton, Thomas J.
SPIE
28.07.2017

Tomi Pitkäaho, Aki Manninen, and Thomas J. Naughton "Focus classification in digital holographic microscopy using deep convolutional neural networks", Proc. SPIE 10414, Advances in Microscopic Imaging, 104140K (28 July 2017); doi: 10.1117/12.2286161; https://doi.org/10.1117/12.2286161

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© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
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doi:https://doi.org/10.1117/12.2286161
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https://urn.fi/URN:NBN:fi-fe2019042613368
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Abstract

In digital holographic microscopy, one often obtains an in-focus image of the sample by applying a focus metric to a stack of numerical reconstructions. We present an alternative approach using a deep convolutional neural network.

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