On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement

Nissinen, J.; Nissinen, I.; Huikari, J.; Jahromi, S.; Jansson, J.-P.; Kostamovaara, J. (2017-12-25)
 
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https://doi.org/10.1109/ICSENS.2017.8233996

Nissinen, J.
Nissinen, I.
Huikari, J.
Jahromi, S.
Jansson, J.-P.
Kostamovaara, J.
Institute of Electrical and Electronics Engineers
25.12.2017

J. Nissinen, I. Nissinen, J. Huikari, S. Jahromi, J. -. Jansson and J. Kostamovaara, "On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement," 2017 IEEE SENSORS, Glasgow, 2017, pp. 1-3. doi: 10.1109/ICSENS.2017.8233996

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doi:https://doi.org/10.1109/ICSENS.2017.8233996
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https://urn.fi/URN:NBN:fi-fe2018121350847
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Abstract

The timing accuracy of a single-photon avalanche diode (SPAD) based receiver is analyzed as a function of excess bias voltage. The width of the used optical pulse was 100 ps, which matches well with the jitter of the used SPAD receiver fabricated in a 0.35 pm HVCMOS technology. The timing error was measured to be 900 ps within the excess bias voltage range of ~1.25 V-3.25 V. The single-shot resolution changes from 420 ps to 160 ps (FWHM), respectively.

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